The Challenges of Micro-System Product Development

08 Jun 2009 | Online Presentations | Contributor(s): James J. Allen

This talk will discuss the historical development of micro‐system technology, the products that have been developed and the challenges to development of a reliable product.

Nanotribology, Nanomechanics and Materials Characterization Studies

05 Jun 2009 | Online Presentations | Contributor(s): Bharat Bhushan

At most solid‐solid interfaces of technological relevance, contact occurs at numerous asperities. A sharp atomic/friction force microscope (AFM/FFM) tip sliding on a surface simulates just one such contact. However, asperities come in all shapes and sizes which can be simulated using tips of …

Experiences with nonintrusive polynomial Chaos and stochastic collocation methods for uncertainty analysis and design

05 Jun 2009 | Online Presentations | Contributor(s): Michael S. Eldred

Non—intrusive polynomial chaos expansion (PCE) and stochastic collocation (SC) methods are attractive techniques for uncertainty quantification due to their abilities to produce functional representations of stochastic variability and to achieve exponential convergence rates in statistics of …

Gas Damping of Microcantilevers at Low Ambient Pressures

05 Jun 2009 | Online Presentations | Contributor(s): Rahul Anil Bidkar

This seminar will present a theoretical model for predicting the gas damping of long, rectangular silicon microcantilevers, which are oscillating in an unbounded gaseous medium with the ambient pressures varying over 5 orders of magnitude (1000 > Kn > 0.03). The work is the result of a …

From density functional theory to defect level in silicon: Does the "band gap problem" matter?

05 Jun 2009 | Online Presentations | Contributor(s): Peter A. Schultz

Modeling the electrical effects of radiation damage in semiconductor devices requires detailed description of the properties of point defects generated during and subsequent irradiation. Such modeling requires physical parameters, such as defect electronic levels, to describe carrier …