Tags: reliability
Resources 2 results (feed)
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From density functional theory to defect level in silicon: Does the "band gap problem" matter?
05 Jun 2009 | Online Presentations | Contributor(s): Peter A. Schultz
Modeling the electrical effects of radiation damage in semiconductor devices requires detailed description of the properties of point defects generated during and subsequent irradiation. Such …
http://memshub.org/resources/6
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The Challenges of Micro-System Product Development
08 Jun 2009 | Online Presentations | Contributor(s): James J. Allen
This talk will discuss the historical development of micro‐system technology, the products that have been developed and the challenges to development of a reliable product.
http://memshub.org/resources/27
Total 2 results found.